ELECTRON MICROSCOPY

Sample

UL33-Gas-Gb1-Gg2-Nb35

Specimen Preperation
Sample Aggregation State PARTICLE
Vitrification Instrument FEI VITROBOT MARK IV
Cryogen Name ETHANE
Sample Vitrification Details ?
3D Reconstruction
Reconstruction Method SINGLE PARTICLE
Number of Particles 54507
Reported Resolution (Å) 3.3
Resolution Method FSC 0.143 CUT-OFF
Other Details CryoSPARC non-uniform refinement
Refinement Type
Symmetry Type POINT
Map-Model Fitting and Refinement
ID 1
Refinement Space REAL
Refinement Protocol FLEXIBLE FIT
Refinement Target ?
Overall B Value 106.4
Fitting Procedure ?
Details ?
Data Acquisition
Detector Type GATAN K3 (6k x 4k)
Electron Dose (electrons/Å2) 50
Imaging Experiment
Date of Experiment ?
Temprature (Kelvin)
Microscope Model JEOL CRYO ARM 300
Minimum Defocus (nm) 600
Maximum Defocus (nm) 1200
Minimum Tilt Angle (degrees) ?
Maximum Tilt Angle (degrees) ?
Nominal CS 3.4
Imaging Mode BRIGHT FIELD
Specimen Holder Model ?
Nominal Magnification ?
Calibrated Magnification 63291
Source FIELD EMISSION GUN
Acceleration Voltage (kV) 300
Imaging Details The microscope model is the JEOL's "JEM-Z320FHC", a custom-built model of JEOL CRYO ARM 300.
Imaging Experiment
Task Software Package Version
PARTICLE SELECTION cryoSPARC 4.6
IMAGE ACQUISITION SerialEM ?
CTF CORRECTION cryoSPARC 4.6
MODEL FITTING Coot 0.9.8.96 EL
INITIAL EULER ASSIGNMENT cryoSPARC 4.6
FINAL EULER ASSIGNMENT cryoSPARC 4.6
CLASSIFICATION cryoSPARC 4.6
RECONSTRUCTION cryoSPARC 4.6
MODEL REFINEMENT PHENIX 1.21.1_5286
Image Processing
CTF Correction Type CTF Correction Details Number of Particles Selected Particle Selection Details
PHASE FLIPPING AND AMPLITUDE CORRECTION CryoSPARC patch CTF estimation and global/local CTF refinements
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