X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 4.0 298 23% PEG 3350, 0.2 M LiSo4, 01. citric acid pH 4.0, 25% glycerol
Unit Cell:
a: 60.457 Å b: 81.762 Å c: 122.190 Å α: 107.238° β: 91.941° γ: 112.386°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 3.18 Solvent Content: 61.36
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 2.45 48.66 73297 3666 97.97 0.2234 0.2579 68.59
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.45 48.66 97.9 ? ? 9.85 3.5 ? 73350 ? -3.0 50.87
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.45 2.60 96.9 ? ? 1.01 3.5 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X06DA 1.000002 SLS X06DA
Software
Software Name Purpose Version
PHENIX refinement 1.21.1_5286
XDS data reduction .
XSCALE data scaling .
PHASER phasing .