ELECTRON MICROSCOPY

Sample

SlNRC3-AVRcap1b complex

Specimen Preperation
Sample Aggregation State PARTICLE
Vitrification Instrument LEICA EM GP
Cryogen Name ETHANE
Sample Vitrification Details ?
3D Reconstruction
Reconstruction Method SINGLE PARTICLE
Number of Particles 267047
Reported Resolution (Å) 3.2
Resolution Method OTHER
Other Details composite map
Refinement Type
Symmetry Type POINT
Map-Model Fitting and Refinement
ID 1
Refinement Space REAL
Refinement Protocol ?
Refinement Target ?
Overall B Value ?
Fitting Procedure ?
Details ?
Data Acquisition
Detector Type GATAN K3 (6k x 4k)
Electron Dose (electrons/Å2) 50.13
Imaging Experiment
Date of Experiment ?
Temprature (Kelvin)
Microscope Model TFS KRIOS
Minimum Defocus (nm) 600
Maximum Defocus (nm) 2000
Minimum Tilt Angle (degrees) ?
Maximum Tilt Angle (degrees) ?
Nominal CS 2.7
Imaging Mode BRIGHT FIELD
Specimen Holder Model FEI TITAN KRIOS AUTOGRID HOLDER
Nominal Magnification 105000
Calibrated Magnification ?
Source FIELD EMISSION GUN
Acceleration Voltage (kV) 300
Imaging Details ?
Imaging Experiment
Task Software Package Version
PARTICLE SELECTION cryoSPARC 4.6.2
IMAGE ACQUISITION EPU 3.4
CTF CORRECTION cryoSPARC 4.6.2
MODEL FITTING Coot 0.9.8.95
MODEL FITTING UCSF ChimeraX 1.8
INITIAL EULER ASSIGNMENT cryoSPARC 4.6.2
FINAL EULER ASSIGNMENT cryoSPARC 4.6.2
CLASSIFICATION cryoSPARC 4.6.2
RECONSTRUCTION cryoSPARC 4.6.2
MODEL REFINEMENT PHENIX 1.21.2
MODEL REFINEMENT ISOLDE 1.8
Image Processing
CTF Correction Type CTF Correction Details Number of Particles Selected Particle Selection Details
PHASE FLIPPING AND AMPLITUDE CORRECTION ?