X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 290 BisTris buffer pH 6.7 Li2SO4 polyethylene glycol 3350
Unit Cell:
a: 98.517 Å b: 99.583 Å c: 104.162 Å α: 77.660° β: 75.940° γ: 67.670°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.14 Solvent Content: 42.64
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 1.61 47.92 321780 16197 70.32 0.1589 0.1932 22.69
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.61 47.92 70.6 0.075 ? 10.2 3.3 ? 437149 ? ? 18.53
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.61 1.668 4.11 ? ? 1.12 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ESRF BEAMLINE ID30B 0.97625 ESRF ID30B
Software
Software Name Purpose Version
REFMAC refinement 1.20.1_4487
PHENIX refinement 1.20.1_4487
XDS data reduction .
STARANISO data scaling .
PHASER phasing .
Feedback Form
Name
Email
Institute
Feedback