X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 291 12.5% w/v PEG 4.000, 20% w/v 1,2,6-hexanetriol, 100mM BES/TEA pH 7.5, 10mM spermine tetrahydrochloride, 10mM spermidine trihydrochloride, 10mM 1,4-diaminobutane dihydrochloride, 10mM DL-ornithine monohydrochloride, 3% DMSO
Unit Cell:
a: 74.550 Å b: 80.310 Å c: 132.500 Å α: 91.920° β: 90.990° γ: 92.410°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.70 Solvent Content: 54.45
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 3.00 34.89 61316 3067 99.88 0.2066 0.2381 71.43
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.0 34.89 99.83 0.2842 ? 6.24 6.9 ? 61337 ? ? 64.23
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.0 3.107 99.82 ? ? 1.99 6.8 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON BESSY BEAMLINE 14.1 0.9184 BESSY 14.1
Software
Software Name Purpose Version
XDS data reduction built 20241002
XDS data scaling built 20241002
PHASER phasing 2.8.3
PHENIX refinement 1.20.1_4487
Coot model building 0.9.8.7
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