X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 4.0 293 Fab at 25 mg/ml in 20 mM Hepes, pH 7.4, 75 mM NaCl versus 1.0 M lithium chloride, 0.1 M citrate pH 4.0, 20% (w/v) PEG 6,000.
Unit Cell:
a: 70.215 Å b: 207.941 Å c: 72.823 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: P 21 21 2
Crystal Properties:
Matthew's Coefficient: 2.85 Solvent Content: 56.91
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 3.30 49.33 15683 1576 93.89 0.2726 0.3195 61.28
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.25 50.00 100.0 0.164 ? 23.0 21.4 ? 17545 ? ? 47.74
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.25 3.31 99.9 ? ? ? 7.6 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 0.97918 APS 19-ID
Software
Software Name Purpose Version
PHENIX refinement 1.21.2_5419
HKL-3000 data scaling .
PHASER phasing .
PDB_EXTRACT data extraction .
HKL-3000 data reduction .
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