X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.6 277.15 0.2 M LiCl, 0.1 M hopes, pH 7.6, 25% PEG 3350
Unit Cell:
a: 50.605 Å b: 59.273 Å c: 90.817 Å α: 89.874° β: 86.307° γ: 89.770°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.74 Solvent Content: 55.06
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 2.45 45.37 36351 2015 93.61 0.2817 0.3335 62.92
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.45 45.37 94 ? ? 5.66 6.3 ? 60886 ? ? 51.65
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.45 2.51 ? ? ? ? ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 5.0.1 0.997 ALS 5.0.1
Software
Software Name Purpose Version
PHENIX refinement 1.21.1_5286
XDS data reduction .
XDS data scaling .
PHASER phasing .
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