X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.5 295.15 0.1 Bis-TRIS pH 6.5, 25% PEG 3350, 30 mM NaF
Unit Cell:
a: 43.447 Å b: 57.090 Å c: 84.088 Å α: 85.57° β: 75.31° γ: 75.13°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 1.97 Solvent Content: 37.56
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 2.01 24.46 44906 1999 89.8 0.200 0.243 30.52
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.010 24.460 89.8 ? ? 4.8100 3.800 ? 44906 ? ? 30.75
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.01 2.06 58.2 ? 4.340 3.30 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 228.15 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU 1.54 ? ?
Software
Software Name Purpose Version
PHENIX refinement DEV_4694
HKL-2000 data reduction .
SCALEPACK data scaling .
PHENIX phasing .