X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.8 277.15 2% PEG 2000 MME, 0.9 M sodium succinate, 0.1 M HEPES pH 6.8, 0.1 M ammonium succinate, 0.5 mM 1-nonanoyl-2-hydroxy-sn-glycero-3-phosphocholine (09:0 lyso-PC)
Unit Cell:
a: 119.235 Å b: 166.281 Å c: 178.491 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: P 21 21 21
Crystal Properties:
Matthew's Coefficient: 4.29 Solvent Content: 71.35
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 3.60 48.38 40600 1995 97.35 0.2672 0.2734 195.58
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.60 50.00 99.9 0.129 ? 18.6 11.6 ? 41605 ? ? 153.79
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.60 3.66 100.0 ? ? 0.875 11.3 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 200 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 24-ID-E 0.98 APS 24-ID-E
Software
Software Name Purpose Version
PHENIX refinement 1.21.1_5286
HKL-2000 data reduction 721
HKL-2000 data scaling 721
PHASER phasing 2.9.0
Coot model building 0.9.8.92