ELECTRON MICROSCOPY

Sample

Straight and symmetrical filament of the spirochete periplasmic flagella from deleted fcpB strain

Specimen Preperation
Sample Aggregation State FILAMENT
Vitrification Instrument FEI VITROBOT MARK IV
Cryogen Name ETHANE
Sample Vitrification Details ?
3D Reconstruction
Reconstruction Method HELICAL
Number of Particles 203738
Reported Resolution (Å) 2.4
Resolution Method FSC 0.143 CUT-OFF
Other Details ?
Refinement Type
Symmetry Type HELICAL
Map-Model Fitting and Refinement
ID 1
Refinement Space REAL
Refinement Protocol FLEXIBLE FIT
Refinement Target ?
Overall B Value 50.5914
Fitting Procedure ?
Details ?
Data Acquisition
Detector Type FEI FALCON III (4k x 4k)
Electron Dose (electrons/Å2) 50
Imaging Experiment
Date of Experiment ?
Temprature (Kelvin)
Microscope Model TFS KRIOS
Minimum Defocus (nm) 500
Maximum Defocus (nm) 2000
Minimum Tilt Angle (degrees) ?
Maximum Tilt Angle (degrees) ?
Nominal CS 0.01
Imaging Mode BRIGHT FIELD
Specimen Holder Model FEI TITAN KRIOS AUTOGRID HOLDER
Nominal Magnification 59000
Calibrated Magnification ?
Source FIELD EMISSION GUN
Acceleration Voltage (kV) 300
Imaging Details ?
Imaging Experiment
Task Software Package Version
IMAGE ACQUISITION EPU ?
CTF CORRECTION Gctf ?
MODEL FITTING Coot ?
INITIAL EULER ASSIGNMENT RELION 3.1.3
FINAL EULER ASSIGNMENT RELION 3.1.3
CLASSIFICATION RELION 3.1.3
RECONSTRUCTION RELION 3.1.3
MODEL REFINEMENT PHENIX 1.21.1_5286
Image Processing
CTF Correction Type CTF Correction Details Number of Particles Selected Particle Selection Details
PHASE FLIPPING ONLY ?
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