X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 293 0.2 M Li2SO4, 20 % PEG 4000, pH 8.0 0.1M MOPS
Unit Cell:
a: 44.900 Å b: 52.498 Å c: 60.802 Å α: 110.83° β: 107.43° γ: 95.81°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.90 Solvent Content: 57.60
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 2.30 29.93 20573 940 96.18 0.2011 0.2429 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.30 30.00 96.6 0.110 ? 9.6 3.2 ? 20609 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.30 2.34 95.3 ? ? ? 2.6 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON PAL/PLS BEAMLINE 5C (4A) 1.003110 PAL/PLS 5C (4A)
Software
Software Name Purpose Version
PHENIX refinement 1.21.1.5286
HKL-2000 data scaling .
HKL-2000 data reduction .
HKL-2000 data scaling .
MOLREP phasing .