X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 9.0 293 0.1M NaCl, 0.1M BICINE pH 9.0, 5mM MgCl2, 20% v/v polyethylene glycol monomethyl ether 550
Unit Cell:
a: 260.909 Å b: 260.909 Å c: 154.18 Å α: 90° β: 90° γ: 90°
Symmetry:
Space Group: P 43 21 2
Crystal Properties:
Matthew's Coefficient: 4.06 Solvent Content: 71.04
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 3.400 93.215 72012 3543 98.140 ? 0.2702 111.481
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.4 99.59 98.5 ? ? 9 6.8 ? 72108 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.40 3.47 98.1 ? ? 2.6 7.1 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ELETTRA BEAMLINE 11.2C 1.0 ELETTRA 11.2C
Software
Software Name Purpose Version
REFMAC refinement 5.8.0430 (refmacat 0.4.100)
autoPX data processing 9.0.001
iMOSFLM data reduction ccp4 9.0.001
Aimless data scaling ccp4 9.0.001
MOLREP phasing ccp4 9.0.001
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