X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8 293 0.1 M Bicine pH 8.0, and 28 % w/v PEG 2000
Unit Cell:
a: 136.990 Å b: 136.990 Å c: 49.660 Å α: 90.00° β: 90.00° γ: 120.00°
Symmetry:
Space Group: P 3 2 1
Crystal Properties:
Matthew's Coefficient: 3.64 Solvent Content: 66.17
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.60 29.66 15840 834 99.78 0.19860 0.27822 53.429
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.6 30 99.8 0.036 ? 10.29 11.7 ? 16691 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.60 2.76 ? ? ? ? ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON PAL/PLS BEAMLINE 5C (4A) 1.000030 PAL/PLS 5C (4A)
Software
Software Name Purpose Version
REFMAC refinement 5.8.0430
XDS data scaling .
XDS data reduction .
MOLREP phasing .