X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.0 293 0.18 M ammonium citrate, 20% w/v PEG 3350
Unit Cell:
a: 85.590 Å b: 89.440 Å c: 93.350 Å α: 70.850° β: 67.037° γ: 61.542°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.50 Solvent Content: 50.85
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 2.10 28.62 117284 6044 91.10 0.2371 0.2921 45.78
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.10 40.72 91.1 0.045 ? 10.6 1.8 ? 117382 ? ? 39.13
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.10 2.14 ? 94.1 ? ? 1.8 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRF BEAMLINE BL17U1 0.97918 SSRF BL17U1
Software
Software Name Purpose Version
PHENIX refinement 1.21.1_5286
Aimless data scaling .
XDS data reduction .
PHASER phasing .
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