X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.0 277 0.4 M ammonium acetate pH 5.0 30% PEG 4000
Unit Cell:
a: 33.127 Å b: 42.590 Å c: 44.242 Å α: 62.08° β: 76.38° γ: 87.00°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.50 Solvent Content: 50.79
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.05 36.65 80135 4232 87.84 0.16515 0.18808 13.452
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.05 36.66 88.6 0.062 ? 14.4 6.8 ? 85077 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.05 1.11 ? 66.5 ? ? 5.3 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X06DA 0.9999 SLS X06DA
Software
Software Name Purpose Version
REFMAC refinement 5.8.0425
Aimless data scaling .
XDS data reduction .
PHASER phasing .
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