X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.6 291 Precipitant: 25.5% (w/v) PEG 4000, 15% (v/v) Glycerol Buffer: 0.085 M Sodium citrate (pH 5.6) Salt: 0.17 M Ammonium acetate
Unit Cell:
a: 39.451 Å b: 32.446 Å c: 41.484 Å α: 90.000° β: 97.580° γ: 90.000°
Symmetry:
Space Group: P 1 2 1
Crystal Properties:
Matthew's Coefficient: 2.28 Solvent Content: 45.96
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 1.15 30.41 34452 644 92.61 0.1595 0.1874 21.26
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.15 30.41 92.61 0.0624 ? 15.22 6.1 ? 34452 ? ? 13.74
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.15 1.24 75.33 ? ? 2.17 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X06SA 1 SLS X06SA
Software
Software Name Purpose Version
PHENIX refinement 1.20.1_4487
XDS data reduction .
SCALA data scaling .
PHASER phasing .
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