ELECTRON MICROSCOPY

Sample

Photosystem II supercomplex C2S2M2L2

Specimen Preperation
Sample Aggregation State PARTICLE
Vitrification Instrument FEI VITROBOT MARK IV
Cryogen Name ETHANE
Sample Vitrification Details ?
3D Reconstruction
Reconstruction Method SINGLE PARTICLE
Number of Particles 225372
Reported Resolution (Å) 2.95
Resolution Method FSC 0.143 CUT-OFF
Other Details ?
Refinement Type
Symmetry Type POINT
Map-Model Fitting and Refinement
ID 1
Refinement Space REAL
Refinement Protocol AB INITIO MODEL
Refinement Target ?
Overall B Value ?
Fitting Procedure ?
Details ?
Data Acquisition
Detector Type FEI FALCON IV (4k x 4k)
Electron Dose (electrons/Å2) 90
Imaging Experiment
Date of Experiment ?
Temprature (Kelvin)
Microscope Model TFS GLACIOS
Minimum Defocus (nm) 500
Maximum Defocus (nm) 2000
Minimum Tilt Angle (degrees) ?
Maximum Tilt Angle (degrees) ?
Nominal CS ?
Imaging Mode BRIGHT FIELD
Specimen Holder Model FEI TITAN KRIOS AUTOGRID HOLDER
Nominal Magnification ?
Calibrated Magnification ?
Source FIELD EMISSION GUN
Acceleration Voltage (kV) 200
Imaging Details ?
Imaging Experiment
Task Software Package Version
PARTICLE SELECTION Scipion 3.0
PARTICLE SELECTION Xmipp 3.0
IMAGE ACQUISITION EPU 3.3
CTF CORRECTION CTFFIND 4.1
MODEL FITTING Coot 0.9.8
MODEL REFINEMENT PHENIX 1.21.2_5419
INITIAL EULER ASSIGNMENT cryoSPARC 4.3.1.
FINAL EULER ASSIGNMENT cryoSPARC 4.3.1.
CLASSIFICATION RELION 3.1
RECONSTRUCTION cryoSPARC 4.3.1.
Image Processing
CTF Correction Type CTF Correction Details Number of Particles Selected Particle Selection Details
PHASE FLIPPING AND AMPLITUDE CORRECTION ?
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