X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.0 298 10 % (w/v) polyvinylpyrrolidone K15, 5 mM CoCl2, 0.1M Tris pH 7.0 + 10% additive solution (5mM 13:0 Lyso PC aka 1-tridecanoyl-2-hydroxy-sn-glycero-3-phosphocholine)
Unit Cell:
a: 249.475 Å b: 90.516 Å c: 200.898 Å α: 90.00° β: 126.91° γ: 90.00°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 3.87 Solvent Content: 68.18
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 3.40 45.26 49444 2472 99.25 0.2467 0.2945 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.40 45.26 99.0 ? ? 5.3 6.9 ? 49483 ? -3.0 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.40 3.60 98.5 ? ? 1.0 7.2 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X06DA 1.000031 SLS X06DA
Software
Software Name Purpose Version
PHENIX refinement (1.21.1_5286: ???)
XDS data reduction .
XSCALE data scaling .
PHASER phasing .
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