X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.0 289.15 K3PO4 0.6M, Na2HPO4 1.3M, Li2SO4 0.2M, CAPS 0.1 M at pH 10.5, PEG 8K 27(v/v)%, AmSO4 0.2 M
Unit Cell:
a: 41.154 Å b: 77.902 Å c: 69.100 Å α: 90.000° β: 92.510° γ: 90.000°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.21 Solvent Content: 44.31
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 1.50 28.28 68831 2078 98.78 0.1591 0.2033 39.67
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.5 30 98.8 ? 0.069 12.10 6.8 ? 68888 ? ? 23.46
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.50 1.51 95.9 ? 2.038 1.04 5.6 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X06SA 0.97626 SLS X06SA
Software
Software Name Purpose Version
XDS data reduction BUILT=20230630
XSCALE data scaling BUILT=20230630
PHENIX phasing 1.20.1_4487
PHENIX refinement 1.20.1_4487