X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.0 293 8% PEG-500MME, 4% PEG-20,000, 100 mM of Bicine/Tris (base) pH 8.0, with 10 mM of Sodium nitrate, sodium phosphate dibasic, Ammonium sulfate.
Unit Cell:
a: 92.092 Å b: 42.065 Å c: 165.794 Å α: 90.000° β: 90.050° γ: 90.000°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.92 Solvent Content: 57.87
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 3.6000 165.7900 12508 677 86.1700 0.2866 0.3029 52.4130
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.4 165.79 99.9 ? ? 13.9 4.0 ? 12807 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.4 3.73 100 ? ? 1.23 4.1 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 21-ID-F 0.97857 APS 21-ID-F
Software
Software Name Purpose Version
REFMAC refinement 5.8.0158
PDB_EXTRACT data extraction 3.28
HKL-2000 data reduction 2.3.12
HKL-2000 data scaling 2.3.12
PHASER phasing 2.7.17
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