X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 3 298 20% hexafluoroisopropanol in water
Unit Cell:
a: 22.950 Å b: 15.490 Å c: 9.520 Å α: 88.665° β: 92.764° γ: 103.947°
Symmetry:
Space Group: P -1
Crystal Properties:
Matthew's Coefficient: 1.55 Solvent Content: 20.72
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION AB INITIO PHASING FREE R-VALUE 1.100 15.03 4615 462 89.438 ? 0.1672 6.533
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.1 15.03 89.4 0.155 ? 3.96 2.7 ? 4615 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.10 1.13 ? ? ? ? ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS-II BEAMLINE 17-ID-2 0.979330 NSLS-II 17-ID-2
Software
Software Name Purpose Version
REFMAC refinement 5.8.0267
XSCALE data scaling 20230630
XDS data reduction 20230630
SHELXD phasing 2013/2