X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8 290 0.2 M ammonium acetate, 8% PEG20000, 10% Hampton Silver Bullet Reagent B5 (0.33% w/v 2,7-naphthalenedisulfonic acid disodium salt, 0.33% w/v azelaic acid, 0.33% w/v trans-cinnamic acid, 0.02 M HEPES sodium pH 6.8)
Unit Cell:
a: 66.110 Å b: 87.314 Å c: 93.159 Å α: 95.220° β: 105.290° γ: 108.350°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.54 Solvent Content: 51.59
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 1.69 40.68 201757 1999 95.99 0.2033 0.2402 40.02
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.689 81.362 96 0.090 ? 5.61 3 ? 201775 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.69 1.75 91.16 ? ? ? 2.7 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS-II BEAMLINE 17-ID-1 0.920105 NSLS-II 17-ID-1
Software
Software Name Purpose Version
autoPROC data processing 1.0.5
PHENIX phasing 1.20.1_4487
PHENIX model building 1.20.1_4487
PHENIX refinement 1.20.1_4487