X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 291 10%(w/v) PEG 8K, 20%(v/v) 1,5-pentanediol 0.02 M of each Amino-acid II 0.1 M MOPSO/bis-tris pH 6.5
Unit Cell:
a: 48.428 Å b: 76.316 Å c: 77.043 Å α: 119.12° β: 95.90° γ: 102.57°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.87 Solvent Content: 57.09
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.10 28.05 48873 1369 94.53 0.18890 0.23279 51.488
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.10 50.00 95.0 0.061 ? 14.8 5.0 ? 50289 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.10 2.14 84.1 ? ? ? 4.0 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU FR-E+ SUPERBRIGHT 1.54 ? ?
Software
Software Name Purpose Version
REFMAC refinement 5.8.0425
HKL-3000 data scaling .
PHASER phasing .
HKL-3000 data reduction .