X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.5 291 20% 4000, 0.2M CaCl2, 0.1M Tris 8.5 , BumuA.00107.d.A2.PW32075 at 21.7 mg/mL. plate Liu-S-128 A5. Overnight soak in 20mM 4,5-dichloro-1,2-catechol (45C) supplemented with 5mM FeCl2. Partial 45C occupancy which was modeled as the enol form. Puck: PSL-1902, Cryo: 32% (w/v) 4000, 0.2M CaCl2, 0.1M Tris 8.5
Unit Cell:
a: 115.393 Å b: 52.306 Å c: 120.402 Å α: 90.00° β: 92.50° γ: 90.00°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 2.63 Solvent Content: 53.22
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 1.62 52.89 91343 4660 99.82 0.1580 0.1831 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.62 120.29 99.9 0.102 ? 10.4 6.2 ? 91411 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.62 1.66 ? 99.9 ? ? 6.3 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS-II BEAMLINE 19-ID 0.9786 NSLS-II 19-ID
Software
Software Name Purpose Version
PHENIX refinement (dev_5449: ???)
Aimless data scaling .
XDS data reduction .
PHASER phasing .
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