X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 293 0.2M MgSO4 (Salt), 20% w/v PEG 4K (Precipitant), 10% v/v Glycerol (Additive)
Unit Cell:
a: 99.625 Å b: 99.625 Å c: 99.625 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 43 3 2
Crystal Properties:
Matthew's Coefficient: 4.36 Solvent Content: 71.82
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 2.57 40.62 2555 256 96 0.1913 0.2386 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.3 40.62 99 ? ? 8 15 ? 1124727 ? ? 52.80
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.30 2.34 ? ? ? ? ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 5.0.3 1 ALS 5.0.3
Software
Software Name Purpose Version
PHENIX refinement (???)
HKL-2000 data reduction .
HKL-2000 data scaling .
PHENIX phasing .
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