X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 4 289.15 After 6 weeks, crystals formed on the PEGIon tray condition 0.2M sodium malonate pH 4.0, 20% w/v Polyethylene glycol 3,350 at 289.15K
Unit Cell:
a: 80.248 Å b: 149.520 Å c: 100.437 Å α: 90.000° β: 113.299° γ: 90.000°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.28 Solvent Content: 46
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 2.10 78.51 126159 6304 99.76 0.2087 0.2383 40.71
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.10 78.51 99.76 0.113 ? 1.4 4.1 ? 126161 ? ? 35.51
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.1 7.25 96.7 ? ? 7.3 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 277.15 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 23-ID-D 0.99 APS 23-ID-D
Software
Software Name Purpose Version
PHENIX refinement 1.21.1_5286
DIALS data reduction 2.2
Aimless data scaling 0.7.4
PHENIX phasing 1.19_4092
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