X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 294 0.1 M Citric Acid, pH 4.0, and 0.8 M Ammonium sulfate
Unit Cell:
a: 56.524 Å b: 61.512 Å c: 85.900 Å α: 97.59° β: 107.34° γ: 112.45°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 3.37 Solvent Content: 63.45
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 2.78 39.37 23090 1986 94.01 0.2390 0.2771 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.78 50.00 95.2 0.146 ? 6.1 2.5 ? 23229 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.78 2.90 97.6 ? ? ? 2.4 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 23-ID-B 0.97930 APS 23-ID-B
Software
Software Name Purpose Version
PHENIX refinement (1.19.2_4158: ???)
MOLREP phasing 1.19.2-4158
HKL-2000 data scaling v722
HKL-2000 data reduction 3.27