9CTE

X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 298 0.1M Tris HCl pH 8.5 and 2.0M Ammonium phosphate monobasic
Unit Cell:
a: 71.273 Å b: 71.273 Å c: 114.942 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: I 41 2 2
Crystal Properties:
Matthew's Coefficient: 2.40 Solvent Content: 48.79
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 2.26 60.57 7287 729 99.78 0.2364 0.2783 49.89
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.255 60.57 99.78 ? ? 7 2 ? 7287 ? ? 39.65
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.255 2.33 ? ? ? ? ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 8.3.1 1.1 ALS 8.3.1
Software
Software Name Purpose Version
PHENIX refinement 1.21_5207
XDS data reduction .
Aimless data scaling .
PHASER phasing .