X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 277 150 mM Lithium Citrate Tribasic, 21.7% (w/v) PEG 3350
Unit Cell:
a: 87.299 Å b: 91.995 Å c: 123.58 Å α: 85.23° β: 70.69° γ: 83.23°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.6 Solvent Content: 53
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.474 116.5 89165 4465 69.4 0.2445 0.2640 73.05
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.474 116.500 90.9 0.0852 ? 7.87 2.62 ? 89165 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 6.992 116.500 98.3 ? ? 18.24 2.79 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 17-ID 1.0 APS 17-ID
Software
Software Name Purpose Version
autoPROC data processing .
XDS data reduction Feb 5, 2021
Aimless data scaling 0.7.4
STARANISO data scaling 2.3.63
BUSTER refinement 2.11.8
PHASER phasing .