ELECTRON MICROSCOPY

Sample

Type I-2 alpha-synuclein filament from multiple system atrophy

Specimen Preperation
Sample Aggregation State FILAMENT
Vitrification Instrument FEI VITROBOT MARK IV
Cryogen Name ETHANE
Sample Vitrification Details Wait time 30s, blot time 7.5s
3D Reconstruction
Reconstruction Method HELICAL
Number of Particles 12802
Reported Resolution (Å) 3.3
Resolution Method FSC 0.143 CUT-OFF
Other Details 3D auto-refinement was performed using the type I-2 map from the first round of 3D classification low-pass filtered to 10 angstroms, allowing rise and twist parameters to vary. The refined map was subject to standard post-processing in RELION.
Refinement Type
Symmetry Type HELICAL
Map-Model Fitting and Refinement
ID 1
Refinement Space ?
Refinement Protocol FLEXIBLE FIT
Refinement Target ?
Overall B Value ?
Fitting Procedure ?
Details ?
Data Acquisition
Detector Type GATAN K3 (6k x 4k)
Electron Dose (electrons/Å2) 46
Imaging Experiment
Date of Experiment ?
Temprature (Kelvin)
Microscope Model TFS KRIOS
Minimum Defocus (nm) 800
Maximum Defocus (nm) 1800
Minimum Tilt Angle (degrees) ?
Maximum Tilt Angle (degrees) ?
Nominal CS 2.7
Imaging Mode BRIGHT FIELD
Specimen Holder Model ?
Nominal Magnification 105000
Calibrated Magnification ?
Source FIELD EMISSION GUN
Acceleration Voltage (kV) 300
Imaging Details ?
Imaging Experiment
Task Software Package Version
PARTICLE SELECTION RELION 4.0.1
IMAGE ACQUISITION SerialEM ?
CTF CORRECTION CTFFIND 4.1
MODEL FITTING PHENIX ?
INITIAL EULER ASSIGNMENT RELION 4.0.1
FINAL EULER ASSIGNMENT RELION 4.0.1
CLASSIFICATION RELION 4.0.1
RECONSTRUCTION RELION 4.0.1
MODEL REFINEMENT PHENIX ?
Image Processing
CTF Correction Type CTF Correction Details Number of Particles Selected Particle Selection Details
PHASE FLIPPING AND AMPLITUDE CORRECTION ?