ISDA: 9C89

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	7.0	291	Index HT C11 + 10% Hampton Additive E5: 1 M ammonium sulfate, 100 mM Hepes pH 7.0, 0.5% (w/v) PEG 8000, 1% (w/v) PEG 3350, EhchA.17554.a.VL2.PK00002 at 3.7 mg/mL. plate 13803 well E5 drop 1. Puck: PSL-0312, Cryo: 80% crystallant + 20% glycerol.

Unit Cell:

a: 100.956 Å b: 100.956 Å c: 63.669 Å α: 90.00° β: 90.00° γ: 120.00°

Symmetry:

Space Group: P 64

Crystal Properties:

Matthew's Coefficient: 4.23 Solvent Content: 70.89

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	MOLECULAR REPLACEMENT	FREE R-VALUE	3.00	43.72	7508	394	99.85	0.2316	0.2587	?

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
3.00	43.72	100.0	0.192	?	8.7	9.7	?	7533	?	?	?

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	3.00	3.18	?	100.0	?	?	10.8	?

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		100 K			?

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	NSLS-II BEAMLINE 19-ID	0.9786	NSLS-II	19-ID

Software