X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 293 3.2 M (NH4)2SO4; 0.1 M Na3Cit pH 5
Unit Cell:
a: 30.751 Å b: 39.132 Å c: 62.897 Å α: 98.15° β: 86.32° γ: 104.91°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 1.87 Solvent Content: 34.16
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.74 34.13 26966 1347 93.72 0.1851 0.2222 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.74 37.49 93.7 0.11599999999999999 ? 8.99 3.6 ? 26971 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.74 1.79 ? ? ? ? ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 24-ID-E .9791 APS 24-ID-E
Software
Software Name Purpose Version
PHENIX refinement (1.21_5207: ???)
XSCALE data scaling .
PDB_EXTRACT data extraction 3.27
XDS data reduction .
PHENIX phasing .
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