X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 291 0.2M magnesium formate, 15-25%PEG3350
Unit Cell:
a: 83.281 Å b: 83.281 Å c: 132.969 Å α: 90.000° β: 90.000° γ: 120.000°
Symmetry:
Space Group: P 32
Crystal Properties:
Matthew's Coefficient: 3.67 Solvent Content: 66.45
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 2.60 17.14 63093 3443 99.83 0.1949 0.2263 36.59
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.58 22.6084 99.8 0.2067 ? 10.62 17.07 ? 73072 ? ? 31.10
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.58 2.68 ? ? ? 2.05 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 21-ID-F 0.978 APS 21-ID-F
Software
Software Name Purpose Version
PHENIX refinement 1.18.2_3874
HKL-2000 data reduction .
XDS data scaling .
PHASER phasing .