X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 290 0.1 M succinic acid pH 7.0, 15% (w/v) PEG 3350, 6 mM strontium chloride hexahydrate, and 10% mixed additive (0.33% w/v 1,5-Naphthalenedisulfonic acid disodium salt, 0.33% w/v Naphthalene-1,3,6-trisulfonic acid trisodium salt hydrate, 0.33% w/v PIPES, and 0.02 M HEPES sodium pH 6.8)
Unit Cell:
a: 103.505 Å b: 103.505 Å c: 53.059 Å α: 90.00° β: 90.00° γ: 120.00°
Symmetry:
Space Group: P 31
Crystal Properties:
Matthew's Coefficient: 2.68 Solvent Content: 54.11
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 3.304 33.88 9026 492 94.7 0.2092 0.2887 51.37
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.22 50.00 99.6 0.076 ? 7.5 10.5 ? 10231 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.22 3.28 100.0 ? ? ? 9.2 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 21-ID-D 1.127 APS 21-ID-D
Software
Software Name Purpose Version
BUSTER refinement 2.10.4 (8-JUN-2022)
HKL-2000 data reduction .
HKL-2000 data scaling .
PHASER phasing .
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