X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 287.15 0.1M HEPES pH 7.5, 12% PEG 3350, 0.5 mM DHB, 0.5 mM AMP
Unit Cell:
a: 56.410 Å b: 74.478 Å c: 75.493 Å α: 85.040° β: 69.890° γ: 70.290°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.31 Solvent Content: 46.8
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 2.30 35.62 47424 2239 96.16 0.1943 0.2352 37.04
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.30 35.62 98.25 0.128 ? 10.32 3.5 ? 47445 ? ? 42
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.30 2.382 97.14 ? ? 1.42 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 93.15 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 23-ID-D 1.03373 APS 23-ID-D
Software
Software Name Purpose Version
PHENIX refinement 1.20.1_4487
xia2 data reduction .
xia2 data scaling .
PHASER phasing .
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