ELECTRON MICROSCOPY


Sample

P2X1 receptor trimer

Specimen Preperation
Sample Aggregation State PARTICLE
Vitrification Instrument FEI VITROBOT MARK III
Cryogen Name ETHANE
Sample Vitrification Details Grids were frozen in liquid ethane using a Vitrobot Mark III operated at 4 degrees Celsius and 100% humidity with 12 blot force and 2 seconds blot time.
3D Reconstruction
Reconstruction Method SINGLE PARTICLE
Number of Particles 41932
Reported Resolution (Å) 2.61
Resolution Method FSC 0.143 CUT-OFF
Other Details ?
Refinement Type
Symmetry Type POINT
Map-Model Fitting and Refinement
ID 1
Refinement Space REAL
Refinement Protocol RIGID BODY FIT
Refinement Target ?
Overall B Value 72.9
Fitting Procedure ?
Details Initial fitting was performed in Chimerax and then refinements were performed in Coot and Phenix.
Data Acquisition
Detector Type GATAN K3 (6k x 4k)
Electron Dose (electrons/Å2) 60
Imaging Experiment
Date of Experiment ?
Temprature (Kelvin)
Microscope Model TFS KRIOS
Minimum Defocus (nm) 500
Maximum Defocus (nm) 1500
Minimum Tilt Angle (degrees) ?
Maximum Tilt Angle (degrees) ?
Nominal CS 2.7
Imaging Mode BRIGHT FIELD
Specimen Holder Model FEI TITAN KRIOS AUTOGRID HOLDER
Nominal Magnification 105000
Calibrated Magnification 105000
Source FIELD EMISSION GUN
Acceleration Voltage (kV) 300
Imaging Details Initial grid screening was conducted using a 200kV TFS Artica cryo-electron microscope prior to imaging on a Titan Krios cryo-electron microscope.
Imaging Experiment
Task Software Package Version
PARTICLE SELECTION cryoSPARC 1.4
CTF CORRECTION cryoSPARC 1.4
MODEL FITTING Coot 0.9.8.92
MODEL REFINEMENT PHENIX 1.20.1
INITIAL EULER ASSIGNMENT cryoSPARC 1.4
FINAL EULER ASSIGNMENT cryoSPARC 1.4
CLASSIFICATION cryoSPARC 1.4
RECONSTRUCTION cryoSPARC 1.4
Image Processing
CTF Correction Type CTF Correction Details Number of Particles Selected Particle Selection Details
PHASE FLIPPING AND AMPLITUDE CORRECTION CTF correction was initially conducted on the set of motion-corrected images, with subsequent local CTF corrections applied to the final subset of particles.
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