ISDA: 8YHM

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	?	289.15	0.1M MOPSO/bis-tris pH 6.5, 5%(w/v) PEG 20K, 25% (w/v) 1,1,1tris(hydroxymethyl)propane, 1%(w/v) NDSB 195, 0.5mM of each Lanthanide: 5mM erbium(III) chloride hexahydrate, 5mM terbium(III) chloride hexahydrate, 5mM ytterbium(III) chloride hexahydrate, 5mM yttrium(III) chloride hexahydrate

Unit Cell:

a: 44.830 Å b: 59.310 Å c: 107.740 Å α: 90.000° β: 90.000° γ: 90.000°

Symmetry:

Space Group: P 21 21 21

Crystal Properties:

Matthew's Coefficient: 2.11 Solvent Content: 41.84

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	MOLECULAR REPLACEMENT	FREE R-VALUE	1.72	39.88	31277	1557	99.95	0.1914	0.2158	34.98

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
1.72	39.88	100	0.082	?	18.9	12.8	?	31340	?	?	25.11

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	1.72	1.75	?	?	?	?	?	?

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		100 K			?

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	SSRF BEAMLINE BL18U1	0.97915	SSRF	BL18U1

Software