8XWO

X-RAY DIFFRACTION


Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 292 0.075 M magnesium chloride hexahydrate, 0.1 M HEPES pH 8, and 22% w/v PEG 1500 at 292 K
Unit Cell:
a: 92.393 Å b: 92.500 Å c: 96.522 Å α: 101.11° β: 101.14° γ: 109.72°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 3.16 Solvent Content: 61.13
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT NONE 3.40 20.02 36512 1695 94.52 0.1861 0.2621 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.40 20.02 95.0 ? ? 53.9 1.9 ? 36533 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.40 3.46 77.3 ? ? ? 1.8 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSRRC BEAMLINE TPS 05A 0.987 NSRRC TPS 05A
Software
Software Name Purpose Version
PHENIX refinement 1.19.2_4158
HKL-2000 data scaling 3.27
HKL-2000 data reduction .
PHENIX phasing .