8XI7

X-RAY DIFFRACTION


Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 293 2.1M ammonium sulfate, 2% PEG 400, 100mM HEPES, pH 7.0
Unit Cell:
a: 109.216 Å b: 109.216 Å c: 79.379 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: P 4 21 2
Crystal Properties:
Matthew's Coefficient: 2.38 Solvent Content: 48.34
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 1.950 48.84 35556 1855 99.947 ? 0.2311 40.415
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.95 48.84 100 0.09 ? 20.9 19.2 ? 35583 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.95 2.00 ? ? ? ? ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON CLSI BEAMLINE 08ID-1 0.95374 CLSI 08ID-1
Software
Software Name Purpose Version
REFMAC refinement 5.8.0419
XDS data reduction .
Aimless data scaling .
PHASER phasing .