X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.0 289 0.2 M sodium sulfate, 0.1 M Bis-Tris Propane pH 7.5, 20 % (w/v) PEG 3350
Unit Cell:
a: 69.084 Å b: 102.442 Å c: 103.977 Å α: 113.830° β: 96.810° γ: 105.450°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.63 Solvent Content: 53.31
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 1.72 38.63 237940 11601 92.18 0.1634 0.1976 21.81
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.72 87.92 92.3 0.070 ? 7.2 2.7 ? 238150 ? ? 18.35
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.72 1.81 69.7 ? ? 1.8 2.6 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 23-ID-B 1.0328 APS 23-ID-B
Software
Software Name Purpose Version
PHENIX refinement 1.20.1_4487
autoPROC data processing .
XDS data scaling .
HKL-3000 phasing .
MOLREP phasing .
XDS data reduction .
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