ISDA: 8VTT

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	8.0	293	2.60 M ammonium sulfate, 0.15 M sodium chloride, 20 mM Tris, 4% 2-propanol, 10 mM neomycin, 25% ethylene glycol

Unit Cell:

a: 77.757 Å b: 77.757 Å c: 213.298 Å α: 90.000° β: 90.000° γ: 120.000°

Symmetry:

Space Group: P 32 1 2

Crystal Properties:

Matthew's Coefficient: 2.99 Solvent Content: 58.84

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	FOURIER SYNTHESIS	FREE R-VALUE	2.45	38.88	24649	1992	89.34	0.2184	0.2569	41.26

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
2.45	50.00	100.0	0.181	?	5.2	11.9	?	27646	?	?	33.85

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	2.45	2.49	100.0	?	?	?	6.2	?

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		100 K			?

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	APS BEAMLINE 19-ID	0.97976	APS	19-ID

Software