ISDA: 8VPW

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	8.8	298	15.5% PEG 3350, 125 MM MGCL2, AND 62 MM TRIS-HCL PH 8.8

Unit Cell:

a: 72.129 Å b: 59.853 Å c: 56.144 Å α: 90.000° β: 115.887° γ: 90.000°

Symmetry:

Space Group: C 1 2 1

Crystal Properties:

Matthew's Coefficient: 2.25 Solvent Content: 45.34

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	FOURIER SYNTHESIS	FREE R-VALUE	1.30	22.00	52778	1997	99.95	0.1289	0.1520	18.10

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
1.30	22.00	99.97	?	?	5.00	54.11	?	52803	?	?	13.28

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	1.30	1.32	100.0	?	?	1.32	16.43	?

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		298 K			?

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
FREE ELECTRON LASER	SLAC LCLS BEAMLINE MFX	1.033	SLAC LCLS	MFX

Software