X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.5 291.15 0.2 M Potassium thiocyanate, 0.1 M Bis Tris propane, 20% w/v PEG 3350
Unit Cell:
a: 39.818 Å b: 64.626 Å c: 69.376 Å α: 94.280° β: 103.900° γ: 107.940°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.36 Solvent Content: 47.92
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 1.77 41.60 111123 3325 90.80 0.1861 0.2293 13.86
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.77 50.00 99.2 0.114 ? 19.8 5.2 ? 111123 ? ? 11.76
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.77 1.80 97.1 ? ? 3.4 2.7 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 101 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU MICROMAX-007 HF 1.54 ? ?
Software
Software Name Purpose Version
PHENIX refinement 1.21_5207
HKL-3000 data reduction .
HKL-3000 data scaling .
PHENIX phasing .