X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.5 295 2 M Ammonium sulfate, 0.1 M Bis-Tris, pH 5.5; apo crystals soaked 5-10 mins with inhibitor G43 (100 mM stock solution in DMSO; 1-2 mM final concentration)
Unit Cell:
a: 149.777 Å b: 149.777 Å c: 304.065 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: P 43 2 2
Crystal Properties:
Matthew's Coefficient: 4.37 Solvent Content: 71.87
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.5000 56.3500 119770 6049 99.9500 0.2007 0.2302 43.6556
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.500 86.900 100.000 0.233 ? 11.800 13.100 ? 119912 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.500 2.540 100.000 ? ? ? 11.800 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 22-ID 1.000 APS 22-ID
Software
Software Name Purpose Version
Aimless data scaling 0.7.4
PHENIX refinement 1.17_3644
PDB_EXTRACT data extraction 3.25
XDS data reduction .
PHASER phasing .
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