X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 291 0.2M Sodium/Potassium phosphate 0.1M Bis Tris propane pH 6.5 20% PEG 3350 10mM DTT 0.5% BOG
Unit Cell:
a: 65.910 Å b: 110.464 Å c: 162.836 Å α: 82.20° β: 77.98° γ: 72.81°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 3.67 Solvent Content: 66.49
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 3.091 47.922 75187 1990 95.99 0.2781 0.3289 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.091 50.00 98.3 0.089 ? 7.3 1.9 ? 76211 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.10 3.21 98.5 ? ? ? 1.9 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 8.2.2 1.0000 ALS 8.2.2
Software
Software Name Purpose Version
PHENIX refinement (1.16_3549: ???)
HKL-2000 data scaling .
HKL-2000 data reduction .
PHASER phasing .
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