X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 277 35% PEG2000 MME, 0.2M KSC and 0.1M HEPES pH 7.0
Unit Cell:
a: 37.800 Å b: 74.840 Å c: 83.450 Å α: 109.10° β: 99.10° γ: 90.58°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 1.99 Solvent Content: 38.05
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 3.02 45.31 15220 755 95.50 0.24416 0.29154 69.333
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.02 45.31 98.9 0.09 ? 8.9 3.5 ? 16544 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.02 3.2 ? ? ? ? ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SPRING-8 BEAMLINE BL45XU 0.979 SPring-8 BL45XU
Software
Software Name Purpose Version
REFMAC refinement 5.8.0238
MOLREP phasing .
XDS data reduction .
XDS data scaling .