X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 291 Index F12: 25% (w/v) Polyethylene glycol 3,350, 0.1 M HEPES pH 7.5, 0.2 M Sodium chloride. MythA.19107.a.UX11.PW39208 at 20.4 mg/mL. 2mM G5A added prior to crystallization. Plate 13386 F12 drop 3. Puck: PSL-1203, Cryo: 20% Glycerol + 80% Crystallant.
Unit Cell:
a: 171.286 Å b: 87.388 Å c: 99.152 Å α: 90.00° β: 104.12° γ: 90.00°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 3.29 Solvent Content: 62.63
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 2.45 41.53 51956 2606 99.34 0.1864 0.2092 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.45 48.08 99.6 0.086 ? 9.8 3.5 ? 52055 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.45 2.53 ? 99.8 ? ? 3.7 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS-II BEAMLINE 19-ID 0.9785 NSLS-II 19-ID
Software
Software Name Purpose Version
PHENIX refinement (1.21rc1_5057: ???)
Aimless data scaling .
XDS data reduction .
PHASER phasing .
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