X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.5 293 1.5 M ammonium sulfate, 0.1 M Tris pH 8.5, 12% glycerol
Unit Cell:
a: 134.708 Å b: 134.708 Å c: 123.118 Å α: 90.000° β: 90.000° γ: 120.000°
Symmetry:
Space Group: P 62 2 2
Crystal Properties:
Matthew's Coefficient: 6.00 Solvent Content: 79.50
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 3.35 45.44 9907 991 99.10 0.2301 0.2487 180.51
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.34 50 100 ? 0.184 24.825 12.1 ? 10007 ? ? 168.95
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.34 3.40 100 ? 6.945 0.326 9.2 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 23-ID-D 1.0332 APS 23-ID-D
Software
Software Name Purpose Version
PHENIX refinement 1.20.1_4487
HKL-2000 data reduction 720
HKL-2000 data scaling 720
PHASER phasing 1.20.1_4487
JBluIce-EPICS data collection .