8SF3

X-RAY DIFFRACTION


Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.6 291 Crystal Screen HT A9: 30% Peg 4K, 0.2M Ammonium Acetate, 0.1M Sodium citrate pH 5.6. LeinA.00629.b.B1.PW39174 at 20 mg/mL. Plate: 13158 well A9 drop 2. Puck: PSL-1408, Cryo: Direct. 2mM AMP and CoA added prior to crystallization. CoA is either disordered or was hydrylozed. Acetate from the crystallization is bound near the AMP.
Unit Cell:
a: 59.017 Å b: 69.383 Å c: 151.619 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 21 21 21
Crystal Properties:
Matthew's Coefficient: 1.96 Solvent Content: 37.10
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 1.70 44.95 68857 3405 99.32 0.1513 0.1872 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.70 151.62 99.5 0.128 ? 12.3 13.0 ? 68961 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.70 1.74 ? 98.5 ? ? 13.6 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS-II BEAMLINE 19-ID 0.9795 NSLS-II 19-ID
Software
Software Name Purpose Version
PHENIX refinement (1.21rc1_4924: ???)
Aimless data scaling .
XDS data reduction .
PHASER phasing .