X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 293 0.1 M Sodium chloride; 0.1 M Bicine pH 9.0; 20% w/v PEG 550 MME
Unit Cell:
a: 201.067 Å b: 201.067 Å c: 92.376 Å α: 90.000° β: 90.000° γ: 120.000°
Symmetry:
Space Group: P 64 2 2
Crystal Properties:
Matthew's Coefficient: 4.18 Solvent Content: 70.57
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 3.11 44.64 20146 1881 99.63 0.1899 0.2376 112.79
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.11 50 99.5 0.256 ? 17.0 39.1 ? 20148 ? ? 103.91
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.11 3.3 98.1 ? ? 1.03 39.1 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X06DA 0.999997 SLS X06DA
Software
Software Name Purpose Version
PHENIX refinement 1.17_3644
XDS data reduction .
XDS data scaling .
PHENIX phasing .